4. Resource Circularity (RC): RC: Keyence, Laser Microscope, VK-X3000

What is it?
Keyence

Manufacturer: VK-X3000

Model Name: The VK-X3000 Series uses a triple scan approach to enable measurement of any target. White light interferometry, focus variation, and laser confocal scanning methods are used depending on the situation, ensuring high-accuracy measurement and analysis of any target. The triple scan approach offers unprecedented adaptability, allowing the system to achieve 0.01 nm resolution to identify the smallest surface irregularities on flat targets, while also offering the flexibility to measure targets with large height changes across areas as large as 50 x 50 mm. With its ability to perform high-magnification colour imaging, non-destructive cross-section measurements, and advanced surface characterization, the VK-X3000 3D Surface Profiler is the go-to-system for R & D and quality labs.

Applications: NA

Instrument Overview: Laser wavelength: VK-X3100: Semiconductor laser, 404 nm VK-X3050: Semiconductor laser, 661 nm Max. laser measurement speed: Surface: 125 Hz, Line: 7900 Hz*2 Max. laser output 0.9 mW Laser class Class 2 (IEC60825-1)

Technical features and specifications:
Extensive magnification coverage range in one device: Magnification 42× to 28,800× Automatic focusing Observe any material Instant, non-contact surface scanning No damage to target: Accurate nano-level measurement Compatible with any shape or material Unprecedented surface characterisation: Quantification of even the most detailed shapes Differentiate surfaces easily Roughness analysis

Charges:
NA

Instrument Manufacturer URL: NA

Detailed Specifications:
NA