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Analytical equipment: (DM) Dimension Icon Scanning Probe Microscope-new

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Singapore Institute of Manufacturing Technology (SIMTECH)

Singapore Institute of Manufacturing Technology (SIMTech) @ CT2B 5 Cleantech Loop #01-01 CleanTech Two Block B Singapore 636732

Bruker Atomic Force Microscope

What is it?
Multi-functional Atomic Force Microscope

Manufacturer: Bruker AXS Pte Ltd

Model Name: Dimension Icon

Applications:
** 3D topography
** Roughness measurement
** Deformation mapping
** Modulus mapping
** Current mapping

Instrument Overview: Dimension Icon AFM is used to measure surface morphology, dimensions and surface properties in nanometer and micrometer scales

Technical features and specifications:

** Vertical resolution: 0.1 nm
** Lateral resolution: down to 5 nm
** Maximum lateral scan size: 90 x 90 µm
** Maximum vertical measuring range: 10 µm
** Temperature Range: -30 degC to 250 degC
** Motorized sample stage: 8 inches

Charges:
TBA

Instrument Manufacturer URL: Dimension Icon AFM | Bruker

Detailed Specifications:
NA

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**A*STAR Scientific Equipment Finder**

Analytical equipment: (DM) Dimension Icon Scanning Probe Microscope-new

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