What is it?
FIB-SEM (Crossbeam)
Manufacturer: Zeiss
Model Name: XB550
Applications: FIB/SEM/TEM sample
preparation & SEM imaging with laser milling appliation
Instrument Overview: FIB-3nm at 30kV;
SEM-0.9 nm @ 15kV (WD 5 mm)
Technical features and specifications:
Range of deposition and etch chemistries.
Charges:
NA
Instrument Manufacturer URL: NA
Detailed Specifications:
NA
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