2 Fusionopolis Way, Innovis, #08-03 Singapore 138634
What is it?
System for the imaging of sample micro area and investigation of the corresponding electronic properties via photoelectron spectroscopy.
Manufacturer: SPECS
Model Name: Proven X-MM
Applications: Characterization of electronic properties of quantum materials of micrometre lateral size
Instrument Overview: The system allows the imaging of micrometre size area of the selected sample by working microscopy mode and characterizes the electronic properties of the selected area by momentum spectroscopy mode.
Technical features and specifications:
Energy resolution < 25 meV
Momentum -Resolution < 0.008 Å-1
Ultimate Lateral resolution in microscopy mode =100 nm
Ultimate Lateral resolution in spectroscopy mode =2 mm
Acceptance Angle ±90o
Sample Temperature < 9 K
Spot Size < 100 µm
Base Pressure < 2x10-10 mbar in Analysis chamber
Charges:
NA
Instrument Manufacturer URL: https://www.specs-group.com/
Detailed Specifications: https://www.specs-group.com/nc/specs/products/detail/provenx-mm/
https://www.specs-group.com/nc/specs/products/detail/kreios-150/
NA
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