Surface probe microscopy: AFM @Syn B1 (Bruker (/ Veeco/ DI) Dimension 3000)

What is it?
This system provides high resolution 3D images for characterization of a large variety of materials.

Manufacturer: Bruker (/ Veeco/ DI)

Model Name: Dimension 3000

Applications: It can operate in numerous imaging modes, the primary operation being atomic force microscopy (AFM) in contact mode, tapping mode, and phase imaging mode. Other data collection techniques include conductive-AFM to characterize conductivity variations; magnetic force microscopy (MFM), which uses a ferromagnetic-coated tip to probe magnetic fields; and force-distance measurements, which are performed to study attractive and repulsive forces on a tip as it approaches and retracts from the sample surface.

Instrument Overview: eg.Transmitted, objective-ring and goose-neck illumination is provided for transmitted and epi-illumination for fluorescence, to cater to the widest possible variety of sample and imaging requirements.

Technical features and specifications:
Specimens can be up to 150mm in diameter and up to 12mm thick
Equipped with an in-line optical zoom microscope with CCD camera, with a maximum magnification of 1000x for precise placement of the probe onto the sample
Scan Size: <100um (X/Y) and <5um (Z)
Controller: Nanoscope III
With Nano-indentation function

Charges:
NA

Instrument Manufacturer URL: eg.NA

Detailed Specifications:
eg.https://tinyurl.com/AMPMVX10