X-Ray Spectroscopy: High Resolution XRD for thin films

What is it?
High resolution X-ray diffraction system to characterize the crystal structure of epitaxial thin films.

Manufacturer: Rigaku, Japan.

Model Name: SmartLab

Applications: X-ray diffraction, X-ray reflectivity of epitaxial thin films

Instrument Overview: Rigaku SmartLab is the newest and most novel high-resolution X-ray diffractometer (XRD) available today. Perhaps its most novel feature is the new SmartLab Studio II software, which provides the user with an intelligent User Guidance expert system functionality that guides the operator through the intricacies of each experiment. It is like having an expert standing by your side.

Technical features and specifications:
High resolution X-ray diffraction system with horizontal sample mounting theta-theta geometry, 9kW X-ray generator, four circle diffractometer, 2D detector

Charges:
N.A.

Instrument Manufacturer URL: https://rigaku.com/products/x-ray-diffraction-and-scattering/xrd/smartlab

Detailed Specifications:
https://rigaku.com/products/x-ray-diffraction-and-scattering/xrd/smartlab