X-Ray Spectroscopy: XRD (Bruker D8 Advance)

What is it?
The D8 Advance is equipped with Cu Kα radiation and position sensitive detector LynxEye, which can provide XRD patterns with very low background noise within short scan time. It also has a thermal chamber that can do in situ measurement at high temperatures.

Manufacturer: Bruker

Model Name: D8 Advance

Applications: The common functions include qualitative and quantitative phase analysis for powder and bulk materials, grazing angle diffraction and texture analysis for thin films, amorphous/crystalline phase analysis for polymers etc. The thermal behaviors such as thermal expansion coefficient, phase transitions/decompositions upon heating, grain merging due to annealing can be measured using in situ XRD either in air, vacuum or inert gas environment.

Instrument Overview: Powder X-ray diffractometer with Bragg Brentano geometry

Technical features and specifications:
Can be used for powder, bulk material and thin film.

Charges:
NA

Instrument Manufacturer URL: https://www.bruker.com/en.html

Detailed Specifications: