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Surface probe microscopy: Time resolved confocal microscope with AFM

equipment

Institute of Materials Research and Engineering (IMRE)

2 Fusionopolis Way, Innovis, #08-03 Singapore 138634

What is it?
A microscope setup for time-domain measurements of fluorescent samples at low light levels.

Manufacturer: Picoquant, Bruker/ JPK Instruments

Model Name: MicroTime 200, JPK Nanowizard 4 XP

Applications: Standard AFM imaging mode: contact, AC, force spectroscopy in air and liquid (water). Special imaging mode: Quantitative Imaging mode (QI) for nanomechanical information from the sample.

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Surface probe microscopy: Time resolved confocal microscope with AFM

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